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. 2023 Dec 13;18(12):e0294678. doi: 10.1371/journal.pone.0294678

Fig 4. Cognitive Testing Battery Results Showing Reaction Time (Mean (SD)) in (A)MPT, (B)VOLT, (C)NBACK, (DIM, (E)LOT, (F)ERT, (G)MRT, (H)DSST, (I)BART, and (J)PVT with Test Condition Wise Comparison.

Fig 4

(Comparison model for test condition i.e. CEC, CEO, YN1W, and YN2W is shown below each time i.e. Mr1, Mr2, and PL. Significant post-hoc p-values are also depicted). #: One-Way Repeated Measure (RM) Analysis of Variance (ANOVA) p-values $: Post-hoc analysis (pairwise comparison) is done using paired t-test with Bonferroni correction (significant changes indicated by p-values given above the bars). @: Friedman’s test p-value (if data is not normally distributed) &: Post-hoc analysis (pairwise comparison) is done using Wilcoxon Signed-Rank test with Bonferroni correction (significant changes indicated by p-values given above the bars). Mr1: Test just before CEC, CEO, YN1W or YN2W; Mr2: Tests conducted just after CEO, C EC, YN1W or YN2W; PL: Test conducted after the lunch.