Skip to main content
. 2024 Jan 2;15:26. doi: 10.1038/s41467-023-44407-4

Fig. 3. Metalens focusing characterization.

Fig. 3

a, b Lateral intensity profiles of metalens at 635 and 670 nm, respectively. c Corresponding horizontal cuts of (a) and (b). d Axial intensity profiles at 635 nm (left panel) and 670 nm (right panel). Scanning measurements in z-direction are carried out at 1-μm intervals.