Table 4.
Changes in XRD diffraction intensities of potassium feldspar during grinding.
Time/min | The Diffraction Peak | ||
---|---|---|---|
Mineral | KAlSi3O8 | SiO2 | NaAlSi3O8 |
2θ | 26.64° | 27.54° | 28.00° |
Crystal plane | 220 | 011 | 002 |
0 | 14,546 | 51,322 | 23,928 |
15 | 11,950 | 15,713 | 10,404 |
90 | 9624 | 9858 | 6803 |
180 | 9211 | 8382 | 5794 |
300 | 7944 | 6273 | 4708 |