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. 2024 Jan 22;24(2):693. doi: 10.3390/s24020693
OOS Out-of-stock
RFID Radio-frequency identification
IR Infrared
DL Deep learning
OSA On-shelf availability
IP Image processing
SVM Support vector machine
CNN Convolutional neural network
3D Three-dimensional
AP Average precision
mAP Mean average precision
FN False negative
FP False positive
TP True positive