Table 6.
Semiconductor characteristics of compounds 2a-g, measured under ambient temperature and atmosphere, in top-contact/bottom-gate TFT device architecture.
| BPhTC | μFET/(cm2 V−1 s−1) | ION/IOF |
|---|---|---|
| 2a | 1.6 × 10−2 | 2.1 × 103 |
| 2b | 5.0 × 10−2 | 4.6 × 102 |
| 2c | 1.0 × 10−2 | 3.1 × 104 |
| 2d | 2.2 × 10−2 | 2.4 × 105 |
| 2e | 3.2 × 10−4 | 4.0 × 104 |
| 2f | 0.77 × 10−4 | 4.3 × 105 |
| 2g | 2.9 × 10−4 | 3.3 × 103 |