Table 6.
Most common FDD algorithms for PV plants.
Reference | Type of Algorithm | Function | Type of Fault | PV-System used | Accuracy |
---|---|---|---|---|---|
[227] | BPNN-GA | Detection | local material ageing, shadowing, open/short circuit | PV Array | – |
[235] | Fuzzy logic | Detection | Arc fault | PV Array | 96 % |
[236] | LAPART algorithm | Detection | Power Reduction | PV Module | 86 % |
[237] | fuzzy inference system | Detection & identification | DC side short-circuits | PV Array | 94 % |
[238] | neuro-fuzzy classifier | Detection & Classification | series losses, faulty by-pass diode, blocking diode | PV Array | 90–98 % |
[231] | ANN | Identification | By-pass diode short circuit, Connection fault | PV System | – |
[232] | RBF-ELM | Classification | short circuit, ageing | PV Array | 88.5 % |
[239] | M-SVM | Identification & classification | Degradation, line-to-line fault | PV Module | 98 % |
[240] | PNN | Detection & Classification | short circuit, disconnected string | PV Array | 100 % |
[241] | fuzzy C-mean (FCM) |
Detection & Classification | short, open, partial occlusion, and other defects | PV Array | 96 % |
[242] | decision tree | Detection & Classification | string, short-circuit, or line-line fault | PV Array | 99 % |
[243] | Improved GA | Identification & localization | short-circuit, | PV String | 95 % |
[244] | random forest (RF) | Detection & Classification | line faults, deterioration, open circuit, fractional shading | PV Array | 99.13 % |