Figure 5.
High-resolution C and O XPS analysis of Ti60Zr20Si8Ge7B3Sn2 MG ribbon surfaces for as-produced (a, e), as-produced and 300 s argon-etched (b, f), TA-functionalized (c, g), and TA-functionalized and 300 s argon-etched (d, h) samples.
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