BEOL	Back-End of the Line
BTI	Bias Temperature Instability
EDMOS	Extended-Drain Metal Oxide Semiconductor
HBD	Hard Breakdown
HCD	Hot-Carrier Damage
HH	Hot Hole
HKMG	High-K Metal Gate
II	Impact Ionization
LOCOS	Locally Oxidized Silicon
MOSFET	Metal-Oxide-Semiconductor Field Effect Transistor
PBTI	Positive Bias Temperature Instability
QS	Quasi-Static
STI	Shallow Trench Isolation
SPAD	Single Photon Avalanche Diode
FDSOI	Fully Depleted Silicon on Insulator
TSV	Through Silicon Via