Table 3.
Collective statistical description of spectral data for all silicon concentrations.
| Wavelength [nm] | Skewness | Kurtosis | Correlation | |
|---|---|---|---|---|
| 892.958 | 39.08 | 1.169 | 2.381 | −0.5 |
| 902.503 | 49.19 | 0.862 | 1.519 | −0.579 |
| 912.048 | 177.44 | 1.327 | 12.857 | −0.237 |
| 921.593 | 293.12 | 1.197 | 12.355 | −0.116 |
| 931.138 | 360.53 | 1.256 | 13.576 | −0.105 |
| … | … | … | … | … |
| 2467.85 | 39.25 | 0.516 | −0.055 | −0.715 |
| 2477.39 | 39.16 | 0.538 | 0.1797 | −0.713 |
| 2486.94 | 39.99 | 0.438 | −0.110 | −0.699 |
| 2496.48 | 38.46 | 0.488 | −0.111 | −0.708 |
| 2506.03 | 38.51 | 0.517 | −0.025 | −0.710 |