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. 2024 Feb 18;24(4):1306. doi: 10.3390/s24041306

Table 3.

Collective statistical description of spectral data for all silicon concentrations.

Wavelength [nm] σ Skewness Kurtosis Correlation
892.958 39.08 1.169 2.381 −0.5
902.503 49.19 0.862 1.519 −0.579
912.048 177.44 1.327 12.857 −0.237
921.593 293.12 1.197 12.355 −0.116
931.138 360.53 1.256 13.576 −0.105
2467.85 39.25 0.516 −0.055 −0.715
2477.39 39.16 0.538 0.1797 −0.713
2486.94 39.99 0.438 −0.110 −0.699
2496.48 38.46 0.488 −0.111 −0.708
2506.03 38.51 0.517 −0.025 −0.710