Fig. 4. Durability of the PSCs.
a, Dark shelf stability of unencapsulated control and DMPESI-treated PSCs and inserted photos are the devices before and after ageing in ambient condition at r.t. with R.H. around 20–40%, five devices for each condition, the initial device PCEs are 23.02 ± 0.26% (DMPESI treated) and 21.03 ± 0.48% (control). b, XRD patterns of shelf-aged control and DMPESI-treated PSCs. c, Temperature cycling (25–85 °C) test of encapsulated control and treated devices, five devices for each condition. d, Damp heat test (85 °C, 85% R.H.) of the encapsulated control and treated devices, five devices for each condition. The initial PCEs of temperature cycling and damp heat tested devices are 22.24 ± 0.22% (DMPESI treated) and 20.12 ± 0.42% (control). Data are presented as mean values ± SEM for a, c and d. e, Long-term operational stability of the unencapsulated control and treated devices under MPPT with continuous 1-sun illumination under N2 flow at room temperature. The linear fitting of DMPESI-treated device maximum power point stability, the initial device PCE is 22.68% (DMPESI treated) and 20.43% (control). f, Operational stability of state-of-the-art highly efficient (PCE > 22%) PSCs extracted from literature8,15,23,25,26,35,37,41,44–78 (perovskite composition based on FAPbI3 marked in green dots; mixed cation–mixed halide marked in blue dots; our work marked in red star).ToF-SIMS depth profiles of the fresh and aged (control and treated) devices of g, I− and h, Au.