Table 1. Data-collection and refinement statistics for serial femtosecond crystallography (SFX) and room-temperature (RT) multi-crystal crystallography.

Values in parentheses are for the highest resolution shell.

Data set	XFEL (SFX)	RT A	RT B	RT C	RT D	RT E
Wavelength (Å)	1.278	0.9794
X-ray focus (µm)	∼3 × 4	∼100 × 100
Pulse energy (µJ)	190	n.a.
Fluence at sample	1.2 × 1011 photons per pulse	1.4 × 1010 photons s−1
Dose per crystal (MGy)	8.3	0.021	0.042	0.063	0.084	0.11
Dose rate (Gy s−1)	1.7 × 1020	7.0 × 102
Space group	P21
a, b, c (Å)	42.49, 41.30, 72.15	42.59, 41.32, 72.50	42.57, 41.33, 72.36	42.71, 41.58, 72.71	42.71, 41.54, 72.75	42.73, 41.59, 72.77
α, β, γ (°)	90, 104.63, 90	90, 104.37, 90	90, 104.28, 90	90, 104.44, 90	90, 104.48, 90	90, 104.90, 90
Oscillation range (°)	Still experiment	1.0
Exposure time	50 fs†	1.0 s
No. of images	729169	30 × 13
No. of hits	153936	n.a.
No. indexed	57713	30 × 13
Resolution (Å)	30.0–1.70 (1.73–1.70)	30.0–1.30 (1.32–1.30)	30.0–1.40 (1.42–1.40)	30.0–1.70 (1.73–1.70)	30.0–1.80 (1.83–1.80)	30.0–1.90 (1.93–1.90)
No. of reflections	3403288	353369	274033	149193	113670	83106
No. unique	25565	59893	48076	27126	23193	19327
Completeness (%)	100.0 (100.0)	99.0 (98.1)	99.2 (98.9)	99.8 (100.0)	99.2 (99.0)	98.7 (99.0)
Multiplicity (%)	130.3 (86.6)	5.9 (5.3)	5.7 (5.2)	5.5 (5.3)	4.9 (4.6)	4.3 (4.3)
〈I/σ(I)〉	5.51 (1.75)	16.00 (2.05)	16.05 (2.15)	16.96 (4.48)	14.48 (4.06)	13.62 (4.09)
R split ‡ (%)	16.5	n.a.	n.a.	n.a.	n.a.	n.a.
R merge (%)	n.a.	12.2 (65.9)	12.1 (96.5)	18.3 (125.2)	19.2 (93.0)	15.7 (76.0)
B factor (Å2)	49.2	22.7	32.1	27.4	24.0	23.9
R work (%)	0.2179 (6.4776)	0.1403 (0.2035)	0.1374 (0.2175)	0.1315 (0.1557)	0.1359 (0.1629)	0.1359 (0.1573)
R free (%)	0.2490 (7.0682)	0.1492 (0.2250)	0.1535 (0.2395)	0.1528 (0.1923)	0.1595 (0.1688)	0.1633 (0.2039)
R.m.s.d., bond lengths (Å)	0.017	0.009	0.009	0.008	0.023	0.009
R.m.s.d., angles (°)	2.05	1.38	1.38	1.04	2.01	1.16
PDB code	8sf1	8sd1	8sd6	8sd7	8sd8	8sd9

^†Electron bunch length.

^‡ R _split =