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. 2024 Mar 5;7:51. doi: 10.1038/s42004-024-01137-y

Fig. 3. Structure of the samples upon heat treatment.

Fig. 3

a Overview STM image showing the result of annealing a sample deposited at RT and annealed at 373 K. b Overview STM image of the same sample as in a, but further annealed at 423 K. Scanning parameters: (a) −1.9 V, 50 pA, (b) −1.9 V, 5 pA.