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Nanostructure information
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| Scanning electron microscopy |
SEM |
Based on backscattered and/or secondary electrons from the sample |
| Morphology of the material with nm resolution |
| Transmission electron microscopy |
TEM |
Based on electrons transmitted through the sample |
| Morphology of the material with resolution down to the atomic level |
| Atomic force microscopy |
AFM |
Based on the repulsive electronic forces between a tip and the sample |
| Topographic images of the surface |
| Scanning tunnelling microscopy |
STM |
Based on the quantum tunnelling effect |
| Imaging of the density of states of the material with (sub)atomic resolution |
| Brunauer–Emmett–Teller analysis |
BET |
Based on gas (typically N2) adsorption experiments |
| Surface area and pore size information |
| X-ray diffraction |
XRD |
Based on the scattering of X-rays by the atoms of the sample |
| Information on the crystalline structure, including interplanar distance |
| Raman spectroscopy |
Raman |
Based on the inelastic scattering of photons due to vibrational states |
| Number of layers, presence of defects, etc.
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Chemical composition
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| Thermogravimetric analysis |
TGA |
Measures changes in weight as a function of temperature |
| Quantitative information about the presence of components with different decomposition/desorption temperatures |
| Inductively coupled plasma mass spectrometry |
ICP-MS |
Based on the ionizing the samples into elemental species |
| Quantitative information on the elemental composition of the materials |
| Energy-dispersive X-ray spectroscopy |
EDS |
Based on the interaction of X-rays with the sample |
| Elemental composition of the materials |
| X-ray photoelectron spectroscopy |
XPS |
Based on the interaction of X-rays with the sample |
| Binding energy of different elements, their electronic state and hybridization |
| Electron energy loss spectroscopy |
EELS |
Based on the inelastic scattering of electrons by the sample |
| Information about types of bonds in the material |
| Infrared spectroscopy |
IR |
Based on the activation of different vibrational modes under infrared radiation |
| Information about bonds present in the material |
| Nuclear magnetic resonance spectroscopy |
NMR |
Based on the magnetic interactions with the spins of the atomic nuclei |
| Information on the bonding environment of the nuclei under observation |
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Electronic structure
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| Ultraviolet-visible-near infrared |
UV-Vis/NIR |
Based on the absorption, reflection and scattering of light |
| Information on electronic transitions of the material |
| Photoluminescence spectroscopy |
PL |
Based on the emission of light by excited states to return to ground state |
| Information on electronic transitions of the material |
| Ultraviolet photoelectron spectroscopy |
UPS |
Based on the interaction of the sample with UV photons |
| Information about the band structure of the material in the valence region |