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. 2024 Jan 26;11(Pt 2):133–139. doi: 10.1107/S2052252524000289

Table 1. Data collection and refinement statistics.

Data collection statistics
PDB entry 8g82
Diffraction source Beamline 17-ID-1, NSLS-II
Wavelength (Å) 0.9213
Temperature (K) 100
Detector Dectris EIGER 9M
Resolution range (Å) 26.5–1.20 (1.24–1.20)
Space group P212121
Unit cell
   a, b, c (Å) 30.49, 71.15, 82.44
  α, β, γ (°) 90.0, 90.0 90.0
No. of observed reflections 276753 (10882)
No. of unique reflections 53037 (3474)
Average multiplicity 5.2 (3.1)
Completeness (%) 93.0 (61.9)
Mean I/σ(I) 13.5 (1.8)
Estimated Wilson B factor (Å2) 13.6
R merge 0.056 (0.657)
R meas § 0.062 (0.777)
R pim 0.026 (0.405)
CC1/2 †† 0.999 (0.668)
 
Refinement and model statistics
No. of reflections used 53028
No. of reflections used for R free 2000
R work 0.153 (0.233)
R free 0.171 (0.292)
No. of non-hydrogen atoms
  Vancomycin 1010
  Ligand 150
  Solvent 288
Average B factor (Å2)
  Vancomycin 15.2
  Ligand 15.5
  Solvent 30.3
RMS deviations from ideality
  Bonds (Å) 0.012
  Angles (°) 1.76
  Clashscore 2.05

Values in parentheses refer to the highest-resolution shell.

R merge is calculated by the equation R merge = Σ hkl Σ i |Ii (hkl) − 〈I(hkl)〉|/Σ hkl Σ i Ii (hkl), where Ii (hkl) is the ith measurement.

§

R meas (or redundancy-independent R merge) is calculated by the equation R meas = Σ hkl [N/(N − 1)]1/2Σ i |Ii (hkl) − 〈I(hkl)〉|/Σ hkl Σ i Ii (hkl), where Ii (hkl) is the ith measurement and N is the redundancy of each unique reflection hkl (Diederichs & Karplus, 1997).

R pim is calculated by the equation R pim = Σ hkl [1/(N − 1)]1/2Σ i |Ii (hkl) − 〈I(hkl)〉|/Σ hkl Σ i Ii (hkl), where Ii (hkl) is the ith measurement and N is the redundancy of each unique reflection hkl (Weiss, 2001).

††

CC1/2 is the correlation coefficient between two randomly chosen half datasets (Karplus & Diederichs, 2012).