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. 2024 Mar 12;14(12):8434–8444. doi: 10.1039/d4ra00558a

Fig. 1. (a) Rietveld refinement52 of sample P1. Experimental data are given in red line, the calculated pattern is shown in blue and difference plot in grey. Green vertical marks show the positions of diffraction lines belonging to monoclinic RAPEAO (C2 space group). (b) Comparison of the PXRD data from sample P1 (blue curve) and BB measurement on the thin film of sample S1 (red curve).

Fig. 1

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