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. 2024 Mar 13;10(11):eadk6308. doi: 10.1126/sciadv.adk6308

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Fig. 2. — (A) Temperature dependence of ρ_xx for the BRO (9 nm) thin film on DTO under B = 0 T (black) and 9 T (red) applied along the [111] direction. The inset shows an enlarged view at low temperatures. Magnetic field (B) dependence of (B) MR ratio [MRR ≡ ρ_xx(B)/ρ_xx(0) – 1] and (C) Hall resistivity (ρ_yx) measured at various temperatures. (D) Anomalous Hall resistivity ρ_AHE obtained by subtracting the ordinary Hall term.