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. Author manuscript; available in PMC: 2024 Mar 14.
Published in final edited form as: Phys Rev B. 2020 Jun;101(22):10.1103/physrevb.101.220405. doi: 10.1103/physrevb.101.220405

FIG. 2.

FIG. 2.

(a) HAADF image showing Ge substrate and FeGe film. (b) Atomic resolution HAADF images showing the B20 phase (top) and Ge-FeGe interface (bottom). (c) Atomic model of B20-phase (top) and Ge with crystal orientation consistent with their respective HAADF images in (b). (d) Regions I (blue) and II (red) highlight two regions with different orientations of FeGe film. (e) Fast Fourier transform (FFT) patterns of the regions I (top) and II (bottom).