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. 2021 Oct 1;7(40):eabj4452. doi: 10.1126/sciadv.abj4452

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Fig. 2. — (A) APF concentration dependence of APF reaction rate (v_APF) (top) and fluorescein dissociation rate (v_d) (bottom). The error bars are the SDs in Gaussian fitting the distribution of catalytic reaction rates from many subregions (basal plane > 250, edge > 80, wrinkle > 30, and vacancy > 10). (B and C) Reaction rate constant k_eff [(B), top], adsorption equilibrium constant of APF K_APF [(B), bottom], direct and indirect desorption rate constants of fluorescein k₁ and k₃ [(C), top], and K [K = k₂/(k₋₂ + k₃)] [(C), bottom] at different structural features of InSe. The error bars were determined from fitting the kinetic data. (D to F) Comparison of k_eff (D), K_APF (E), and k₃ (F) on the basal plane (k_eff-BP, K_APF-BP) and at defects (k_eff-D, K_APF-D) in same InSe flakes (n = 12). The error bars were determined from fitting the kinetic data.