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. 2024 Feb 29;16(10):12744–12753. doi: 10.1021/acsami.3c16241

Figure 7.

Figure 7

XRD scan of 15 and 750 nm thick PMN–PT films grown on LBSO of 2, 4, 9, 15, and 100 u.c. (a) θ–2θ scans of 15 nm thick PMN–PT thin films grown on LBSO of different thicknesses. (b) Idem for 750 nm thick PMN–PT thin films. The inset is ω scan of (002) reflection of 750 nm PMN–PT film on 100 u.c. LBSO. Dashed columns refer to the atomic percentage of stoichiometric [Pb(Mg0.33Nb0.67)O3]0.67–(PbTiO3)0.33.