Table 4.
Heritability of the different robustness criteria and accuracy of their EBV for resistance and resilience (mean ρ ± SD)
Set | h 2 | ρ (EBV, uresis) | ρ (EBV,uresil) |
---|---|---|---|
Smin | |||
Set 1 | 0.12 ± 0.14 | 0.29 ± 0.09 | 0.05 ± 0.10 |
Set 2 | 0.12 ± 0.09 | 0.33 ± 0.09 | 0.04 ± 0.08 |
Set 3 | 0.17 ± 0.17 | 0.30 ± 0.09 | 0.04 ± 0.09 |
Set 4 | 0.16 ± 0.17 | 0.27 ± 0.12 | 0.03 ± 0.09 |
Sresil | |||
Set 1 | 0.19 ± 0.24 | −0.11 ± 0.09 | 0.09 ± 0.08 |
Set 2 | 0.19 ± 0.16 | −0.14 ± 0.08 | 0.11 ± 0.08 |
Set 3 | 0.23 ± 0.26 | −0.12 ± 0.09 | 0.10 ± 0.09 |
Set 4 | 0.18 ± 0.19 | −0.11 ± 0.09 | 0.09 ± 0.09 |
ABT | |||
Set 1 | 0.13 ± 0.17 | −0.17 ± 0.09 | −0.03 ± 0.09 |
Set 2 | 0.13 ± 0.14 | −0.21 ± 0.09 | −0.04 ± 0.08 |
Set 3 | 0.16 ± 0.20 | −0.18 ± 0.09 | −0.03 ± 0.09 |
Set 4 | 0.13 ± 0.17 | −0.16 ± 0.11 | −0.03 ± 0.09 |
Smin, slope minimum; Sresil, slope for resilience; ABT, area-between trajectories.
Set 1, 20% of all hierarchical levels (batch, pen, individual) exposed to disturbances; Set 2, 40% of all hierarchical levels exposed to disturbances; Set 3, 20% of batch and pen level exposed to disturbance. Set 4, 20% of all hierarchical levels exposed to disturbances, four batches.