Fig. 4. Charge carrier extraction and recombination dynamics of devices.

a J-V curves of PM6:Y6 devices processed under three different conditions and b their effective mobilities (μ_eff) derived as a function of corrected voltage (V_cor) from capacitance spectroscopy. c Photocurrent (J_ph) plotted against the effective bias (V_eff). d A direct comparison of the Langevin reduction factor ($\gamma$) and bulk trap state density (N_tb) between the three devices obtained from recombination current fittings. e Intensity-dependent V_OC measurements. The ideality factors (n) obtained from fittings are highlighted. f Schematics showing different recombination mechanisms in PM6:Y6 devices.