. 2024 Apr 4;14(16):10930–10941. doi: 10.1039/d4ra00634h

Output parameters of current–voltage (JV) curves simulated of PSCs with n-i-p and p-i-n configurations, varying the HTLs and ETLs, fixing N_t in 4.5 × 10¹⁷ cm⁻³ and the perovskite thickness in 350 nm. The thickness of HTL/ETL is 200 nm and 30 nm, respectively.

Simulated PSCs	HTL/ETL	V _oc (V)	J _sc (mA cm⁻²)	FF (%)	PCE (%)
n-i-p^a	Spiro/TiO₂	0.68	17.87	49.99	6.12
n-i-p	CuI/TiO₂	0.68	12.23	52.40	6.54
n-i-p	CuI/ZnO	0.68	18.70	53.82	6.89
p-i-n^a	PEDOT/PCBM	0.55	5.84	37.15	1.18
p-i-n	CuI/TiO₂	0.66	4.15	38.87	1.06
p-i-n	CuI/ZnO	0.62	4.83	45.04	1.35

Simulations based on reference PSCs configurations. Regular PSC ref.: Spiro/TiO₂, PCE = 5.23%;¹² iPSC ref.: PEDOT:PSS/PCBM, PCE = 1.39%.⁵⁸

Output parameters of current–voltage (JV) curves simulated of PSCs with n-i-p and p-i-n configurations, varying the HTLs and ETLs, fixing Nt in 4.5 × 1017 cm−3 and the perovskite thickness in 350 nm. The thickness of HTL/ETL is 200 nm and 30 nm, respectively.