Values of L and τ according to the N_t variation. N_t is the defect density of light-absorbing material, L is the charge diffusion length and τ is the charge carrier lifetime.

N t (cm−3)	L (nm)	τ (s)
4.5 × 1013	676.50	1.11 × 10−7
4.5 × 1014	213.93	1.11 × 10−8
4.5 × 1015	67.65	1.11 × 10−9
4.5 × 1016	21.40	1.11 × 10−10
4.5 × 1017	6.76	1.11 × 10−11