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. 2024 May 5;24(9):2933. doi: 10.3390/s24092933
ADR Automated Defect Recognition
CAD Computer-Aided Design
CNN Convolutional neural Network
CLAHE Contrast-limited Adaptive Histogram Equalization
CSG Constructive Solid Geometry
CT Computed Tomography
ED-CNN Evenly Distributed Convolutional Neural Network
FBP Filtered Back-projection
FML Fiber–Metal Laminate (Composite material)
GUW Guided Ultrasonic Wave
High-Q High-Quality Device
HPDC High-Pressure Die Casting (Manufacturing Process)
Low-Q Low-Quality Device
LP Line Pairs (Optical quality)
LPDC Low-Pressure Die Casting (Manufacturing Process)
Mid-Q Mid-Quality Device
ML Machine Learning
NDT Non-destructive Testing
OEM Original equipment manufacturer
RD Real (Measuring) Data
ResNet Residual Neural Network
RO Region of Interest
SAM Segment Anything Model
SD Synthetic Data
SNR Signal-to-Noise Ratio
STL Stereo Lithography (File format)
YOLO You Only Look Once (ML Model architecture)