| ADR | Automated Defect Recognition |
| CAD | Computer-Aided Design |
| CNN | Convolutional neural Network |
| CLAHE | Contrast-limited Adaptive Histogram Equalization |
| CSG | Constructive Solid Geometry |
| CT | Computed Tomography |
| ED-CNN | Evenly Distributed Convolutional Neural Network |
| FBP | Filtered Back-projection |
| FML | Fiber–Metal Laminate (Composite material) |
| GUW | Guided Ultrasonic Wave |
| High-Q | High-Quality Device |
| HPDC | High-Pressure Die Casting (Manufacturing Process) |
| Low-Q | Low-Quality Device |
| LP | Line Pairs (Optical quality) |
| LPDC | Low-Pressure Die Casting (Manufacturing Process) |
| Mid-Q | Mid-Quality Device |
| ML | Machine Learning |
| NDT | Non-destructive Testing |
| OEM | Original equipment manufacturer |
| RD | Real (Measuring) Data |
| ResNet | Residual Neural Network |
| RO | Region of Interest |
| SAM | Segment Anything Model |
| SD | Synthetic Data |
| SNR | Signal-to-Noise Ratio |
| STL | Stereo Lithography (File format) |
| YOLO | You Only Look Once (ML Model architecture) |