Table 2. Lateral Actuation Strain at the Maximum Electric Breakdown (s), Dielectric Breakdown (Eb,max), and Original Film Thickness (d0).
| entry | sa [%] | sarealb [%] | voltagec [V] | d0d [μm] | Δde [μm] | Eb,maxf [V/μm] | ε′h | ΔEdens [J/g] |
|---|---|---|---|---|---|---|---|---|
| mix-co-Pg | 5.7 | 11.7 | 2500 | 91 | 9.5 | 30.7 | 3.83 | 0.44 |
| mix-co-CN | 4.2 | 8.6 | 500 | 16 | 1.3 | 33.9 | 5.23 | 0.98 |
| mix-co-E | 5 | 10.2 | 600 | 36 | 0.4 | 62.4 | 5.24 | 0.5 |
Lateral strain at the maximum electric breakdown.
Areal strain at the maximum electric breakdown.
Voltage at the maximum electric breakdown.
Original thickness of the thin film.
Change in thickness Δd = d0 – d, considering the corresponding thickness d: d = d0/(s + 1)2.
Exact breakdown fields of the thin film given by Eb,act = [Voltage]/d.
Prestrained by 100%.
Taken at 20 Hz.