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. 2024 May 18;15:4242. doi: 10.1038/s41467-024-48677-4

Fig. 2. Phase and structural characterizations of p-type CoSb3-based skutterudite flexible thin films.

Fig. 2

a X-ray diffraction (XRD) patterns of CexFe3CoSb12 thin films (x = 0.25, 0.50, 0.75, 1.25, and 1.50) on flexible polyimide (PI) substrates. The 2θ range is from 20 ° to 67 °. b Photograph of a Ce1.25Fe3CoSb12 flexible thin film on a PI substrate from a top view. The size of the thin film is >30 × 30 mm2. c Top-view scanning electron microscopy (SEM) image of Ce1.25Fe3CoSb12 thin film and (d) corresponding energy dispersive spectrometry (EDS) maps for Sb, Co, Fe, and Ce. e Atomic force microscopy (AFM) image of Ce1.25Fe3CoSb12 thin film. f Percentage distribution of nanoparticle diameters in the film structure. g SEM image of a Ce1.25Fe3CoSb12 flexible thin film on a PI substrate from a cross-sectional view.