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. 2024 May 18;15:4242. doi: 10.1038/s41467-024-48677-4

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© The Author(s) 2024

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 4 — a Low-magnification TEM image of the Ce_1.25Fe₃CoSb₁₂ thin film used for nanostructure analysis. b Corresponding selected area electron diffraction (SAED) pattern. c TEM image of a large particle in the thin film structure. d High-resolution TEM (HRTEM) image of nanograins between large particles. e HRTEM image of nanograins taken from another area with indexed lattice information. f Corresponding filtered HRTEM image to show lattice distortions and a potential edge-like dislocation. g TEM image of a large particle with quantum-dot-sized nanoinclusions in it. The inset shows a corresponding fast Fourier transform (FFT) pattern. h HRTEM image of these quantum-dot-sized nanoinclusions magnified from (g). i Corresponding filtered image.