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. 2024 Jun 4;15:4743. doi: 10.1038/s41467-024-47917-x

Fig. 1. Preparation and structural characterization of SrTiO3 membranes.

Fig. 1

a Schematics of the s-SNOM/SINS measurement on an SrTiO3 membrane. b Atomic-resolution STEM imaging of a freestanding SrTiO3 membrane suspended on a SiNx TEM grid. Inset shows the Fourier-transform of the STEM image. c The optical image of the SrTiO3 membrane transferred on a thermally oxidized Si substrate with part of the surface coated by a 50 nm thick gold film. The white arrow denotes the edge of the membrane. The inset shows the trace of SINS line scan across the edge of the membrane supported on SiO2/Si substrate. d A line scan of the height profile across the edge of the membrane. The inset indicates the trace of the line scan.