MEMS | Micro-Electromechanical Systems |
DUV | Deep Ultraviolet |
EUV | Extreme Ultraviolet |
CARs | Chemically Amplified Resists |
n-CARs | Non-Chemically Amplified Resists |
LER | Line Edge Roughness |
LWR | Line Width Roughness |
PMMA | Poly(methyl methacrylate) |
DNQ | Diazonaphthoquinone |
DFP | Dry Film Photoresist |
PCB | Printed Circuit Board |