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. 2024 Jun 4;17(11):2726. doi: 10.3390/ma17112726
EBSD Electron Backscatter Diffraction
GND Geometrically Necessary Dislocation
HAADF High-Angle Annular Dark Field
HAB High-Angle Boundary
HPTE High-Pressure Torsion Extrusion
LAB Low-Angle Boundary
LOM Light Optical Microscopy
OIM Orientation Imaging Microscopy
PBS Phosphate Buffered Saline
SEM Scanning Electron Microscope
SPD Severe Plastic Deformation
TEM Transmission Electron Microscope
UFG Ultrafine Grained