Skip to main content
. 2024 Jun 4;17(11):2727. doi: 10.3390/ma17112727

Figure 1.

Figure 1

(a) HR-XRD ω/2θ broad scan spectra ranging from 15° to 75° for as-grown, 400 °C, 600 °C, and 800 °C annealed-Ga2O3/Pt/sapphire, and (b) measurement of ω/2θ spectra focused on the low-XRD-intensity region to identify weak β-Ga2O3 (−201) and (−603) peaks.