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. Author manuscript; available in PMC: 2024 Aug 12.
Published in final edited form as: Nat Methods. 2024 Feb 12;21(2):182–194. doi: 10.1038/s41592-023-02150-0

Extended Data Tab. 1. Overview of pitfall sources for image-level classification metrics.

((a): counting metrics, (b): multi-threshold metrics) related to poor metric selection [P2]. Pitfalls for semantic segmentation, object detection and instance segmentation are provided in Extended Data Tabs. 25 respectively. A warning sign indicates a potential pitfall for the metric in the corresponding column, in case the property represented by the respective row holds true. Comprehensive illustrations of pitfalls are available in Suppl. Note 2. A comprehensive list of pitfalls is provided separately for each metrics in the metrics cheat sheets (Suppl. Note 3). Note that we only list sources of pitfalls relevant to the considered metrics. Other sources of pitfalls are neglected for this table.

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