Fig. 2. Scanning single-spin magnetometry measurements of small-twist-angle tDT CrI₃.

a Schematic illustration of scanning NV measurements of twisted CrI₃. b Optical microscope image of a small-twist-angle tDT CrI₃ sample. The two torn trilayer CrI₃ flakes are outlined by the black and blue dashed lines, respectively, and the twisted area is highlighted by the red dashed lines. Scale bar is 10 μm. c, f Nanoscale scanning NV imaging of magnetic stray fields emanating from selected sample areas of a 0.15° tDT CrI₃ (c) and a 0.25° tDT CrI₃ device (f). d, g Magnetization maps reconstructed from the stray field patterns shown in c and f for the 0.15° tDT CrI₃ (d) and 0.25° tDT CrI₃ (g) sample. e, h Normalized autocorrelation (AC) maps of the stray field patterns shown in c and f for the 0.15° tDT CrI₃ (e) and 0.25° tDT CrI₃ device (h). Scale bar is 200 nm for images presented from c to h.