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. 2024 Apr 16;4(4):346–353. doi: 10.1021/acsmaterialsau.4c00011

Figure 1.

Figure 1

(a) Geometry for specular NR from a sample consisting of a thin film (of thickness d) on top of a substrate. (b) Example reflectivity profil and corresponding nSLD (inset) for the sample in (a). The critical edge (Qc) and the period of the Kiessig fringes, which relates to the film thickness as ΔQ = 2πd–1, are indicated.