Fig. 7. Thermal transient reflectance (TTR) images of n-type Si plain membranes (L = 20 μm, W = 20 μm) under a 7.5 V voltage bias, with (a) employing a 365 nm wavelength and Pt coefficient of thermal reflectance (CTR) of 1.2 × 10−4 K−1, and (b) using a 365 nm wavelength with Si CTR of 1.37 × 10−4 K−1. (c) Temperature difference as a function of voltage bias for plain; n-type (PNL20W20) and p-type (PPL60W10) membranes: comparison of electrical and thermal measurement techniques.
