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. 2024 Jul 8;128(28):11699–11708. doi: 10.1021/acs.jpcc.4c02229

Figure 4.

Figure 4

(a) SEM images of 30–10–30 nm trimers. Left: SE (secondary electron) detector. Right: BSE (backscattered electron) detector. Scale bar: 20 nm. (b) Additional heterotrimer images using the BSE mode. All scale bars: 100 nm. (c) Bending angle analysis. Inset: schematic of the bending angle θ.