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. 2024 Jul 22;18(30):19732–19741. doi: 10.1021/acsnano.4c05251

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© 2024 The Authors. Published by American Chemical Society

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EELS line profiles of surface oxides on Nb and Ta. a, HAADF-STEM micrograph of the NbO_x-Nb interface of the bare Nb thin film. Colored spots denote the positions in which EEL spectra are taken. b, c, Corresponding spatially resolved EEL spectra showing ELNESs of Nb M₂₃ edge and O K edge. d, HAADF-STEM micrograph of the TaO_x-Ta interface of Ta-capped Nb thin film. Colored spots denote the positions in which EEL spectra are acquired. e, f, Corresponding spatially resolved EEL spectra showing ELNESs of Ta O₂₃ edge and O K edge. The distance between adjacent spots is 0.83 nm.