Skip to main content
. 2024 Jul 29;14(15):1275. doi: 10.3390/nano14151275

Figure 2.

Figure 2

AM mode scans post-contact mode imaging at Set Point forces of (A) 100 nN, (B) 250 nN, and (C) 500 nN, scale bars represent 200 nm. (D) RMS and (E) Ra of post-AM mode scans concerning applied Set Point. The findings are presented as the mean ± SD, based on a sample size of n = 5.