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. 2024 Aug 10;15:6860. doi: 10.1038/s41467-024-50846-4

Fig. 2. Limit and image quality of beam deflection.

Fig. 2

a Maximal number of subtiles imaged with beam deflection in the JEOL 1200EX-II TEM. Each tile has 6000 × 6000 pixels with a pixel size of 3.6 nm. Representative images of 3 independent experiments. b A fully stitched montage of the full subtiles in a. Each tile and its neighboring tiles have overlap, which is used for the stitching. c Zoom-in images of three highlighted tiles from a. d The signal-to-noise ratio (SNR) as a function of spatial frequency (Methods) for each image was computed and shown with colors of the tiles indicated in the legend. Spectral-SNR is the integral over the full spectral width. e Distortion of the 9-tile configuration. The non-rigid displacements (Methods) of evenly spaced image features before and after stitching are visualized as color-intensity-encoded vectors. Color hue indicates the direction and intensity indicates the magnitude of displacement at a scale of 30 pixels (radius of color wheel).