PTFE-Teflon: polytetrafluoroethylene |
DRV: dynamic recovery |
Manuf: Manufacturer |
DRX: dynamic recrystallization |
XRD: x-ray diffraction |
CDRX: continuous dynamic recrystallization |
SEM: Scanning Electron microscope |
PDP: Potentiodynamic Polarization |
EBSD: Electron Back-scattered Diffraction |
IPFs: Inverse pole figures |
RT: Room Temprature |
KAM: Kernal average misorientation |
OES: optical emission spectrometer |
LAGBs: Low angle grain boundaries |
Ra: Surface roughness |
HAGBs: High angle grain boundaries |
WL: Weight loss |
IQ: Image quality |
TWI: Taber Wear Index |
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