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. 2024 Jul 31;10(15):e35507. doi: 10.1016/j.heliyon.2024.e35507

Fig. 7.

Fig. 7

XPS depth profiling of (a) O1s, (c) Nb3d, (e) Mg2p, and (g) F1s of sample 4; fine scan XPS of (b) O1s, (d) Nb3d, (f) Mg2p, and (h) F1s at the Nb2O5/MgF2 interface of sample 4.