Table 2. Summary of the CV and AFM Figures of Merit Obtained with n-Si/Au/FcHT Photoelectrodesa.
| [Au] (mM) | ECSA (cm2) | Γ (mol cm–2) | E1/2(V) vs SCE | ΔEp (mV) | FWHM (mV) | dparticle(nm) | RMS roughness (nm) |
|---|---|---|---|---|---|---|---|
| 0.2 | 0.14 ± 0.03 | 4(±2) × 10–10 | 0.003 ± 0.011 | 12 ± 4 | 89 ± 11 | 45 ± 10 | 6.6 |
| 0.5 | 0.20 ± 0.02 | 4(±4) × 10–10 | 0.029 ± 0.017 | 29 ± 11 | 86 ± 13 | 47 ± 12 | 10.4 |
| 1 | 0.20 ± 0.05 | 6(±4) × 10–10 | 0.082 ± 0.044 | 41 ± 16 | 50 ± 22 | 61 ± 26 | 10.6 |
a
Values are reported as the mean ± standard deviation of three independently prepared samples from CVs recorded at 0.4 V s–1 in 0.1 M HClO4.