Table 2. The surface roughness values (Ra) of Omnichroma and Filtek™ Z250 XT specimens using AFM.
* P < 0.05 was accepted as a significance level.
* An independent t-test was performed.
Ra1, calculated average between peaks and valleys on a surface before performing the test; Ra2, calculated average between peaks and valleys on a surface after performing the test
AFM, atomic force microscopy; FL, Filtek; OM, Omnichroma
| Specimen | Ra1 (nm) | Average (nm) | Ra2 (nm) | Average (nm) | *P-value |
| OM1 | 35.6874 | 17.03324 | 45.8817 | 33.1481 | 0.00821 |
| OM2 | 3.94619 | 34.7281 | |||
| OM3 | 3.54613 | 18.5272 | |||
| OM4 | 18.0108 | 25.4375 | |||
| OM5 | 23.9757 | 41.166 | |||
| FL1 | 24.0495 | 18.3734 | 40.557 | 49.5171 | 0.019999 |
| FL2 | 15.8139 | 19.9283 | |||
| FL3 | 14.2167 | 67.1182 | |||
| FL4 | 22.2408 | 46.8907 | |||
| FL5 | 15.5461 | 73.0913 |