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. 2024 Aug 27;15:7387. doi: 10.1038/s41467-024-51479-3

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© This is a U.S. Government work and not under copyright protection in the US; foreign copyright protection may apply 2024

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Fig. 4 — a XRD of as-grown NdNiO₃ and reduced NdNiO₂ films showing partial reduction to the infinite-layer phase. b STEM of an equivalent sister NdNiO₂ sample revealing extended defects concentrated near the surface. c SIMS depth profile of the as-grown NdNiO₃ film. d SIMS depth profile of the NdNiO₂ film, reduced for an extended time of 6 h at 290 °C. SIMS shows increased hydrogen concentration at the surface even without full oxygen removal.