Figure - PMC

Skip to main content

An official website of the United States government

Here's how you know

Here's how you know

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you've safely connected to the .gov website. Share sensitive information only on official, secure websites.

View full-text article in PMC

. 2024 Aug 27;15:7387. doi: 10.1038/s41467-024-51479-3

Search in PMC
Search in PubMed
View in NLM Catalog
Add to search

© This is a U.S. Government work and not under copyright protection in the US; foreign copyright protection may apply 2024

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/.

PMC Copyright notice

Fig. 5 — a XRD on Nd_0.8Sr_0.2NiO₃ films grown by PLD, with and without a 10 nm SrTiO₃ cap, showing a weak film (001) peak both before and after reduction, indicating a low-crystallinity as-grown film. Reduction further lowers crystallinity. b Atomic-resolution cross-sectional HAADF-STEM micrograph from the reduced SrTiO₃/Nd_0.8Sr_0.2NiO₂ film showing amorphous (marked as 1) and crystalline regions (marked as 2 and 3). The low-crystalline quality of the film after reduction is clearly visible and agrees with the XRD data. c SIMS depth profile of the as-grown Nd_0.8Sr_0.2NiO₃ film indicates a separate surface layer. d SIMS depth profile of the reduced Nd_0.8Sr_0.2NiO₂ film with a SrTiO₃ cap, showing non-negligible but small hydrogen incorporation at the SrTiO₃ cap/Nd_0.8Sr_0.2NiO₂ interface.