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. 2024 Aug 28;6(20):5031–5041. doi: 10.1039/d4na00191e

Fig. 4. (a) AFM height images of CLP-based samples: a1, a2, a3, a4 are CLP 20P, CLP/H2O 20P, CLP on CNF 20P, CLP/CNF 20P, respectively. (b) AFM phase images of CLP-based samples: b1, b2, b3, b4 are CLP 20P, CLP/H2O 20P, CLP on CNF 20P, CLP/CNF 20P, respectively. (c) Mean roughness distribution of CNF and CLP-based samples. The mean roughness of CNF 20P, CLP 20P, CLP/H2O 20P, CLP on CNF 20P, CLP/CNF 20P are 11 ± 1 nm, 16 ± 1 nm,17 ± 1 nm, 19 ± 1 nm, 13 ± 1 nm, respectively. (d) Thickness distribution of CNF and CLP-based samples. The thickness of CNF 20P, CLP 20P, CLP/H2O 20P, CLP on CNF 20P, CLP/CNF 20P are 109 ± 10 nm, 873 ± 170 nm, 883 ± 100 nm, 947 ± 170 nm, 312 ± 40 nm, respectively.

Fig. 4