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. 2024 Jul 9;12(18):4664–4681. doi: 10.1039/d4bm00172a

AFM derived roughness values (Rq/Ra) for SNAP coated substrates. Values represent the mean value obtained from three measurements on three separate areas of the substrate.

Control 2 w/v% 4 w/v% 4 w/v% OC
R q R a R q R a R q R a R q R a
6.87 ± 1.42 5.37 ± 1.08 236.6 ± 25.4 189.3 ± 22.1 442.3 ± 107 341.3 ± 82.1 467.6 ± 99.4 378.6 ± 89.6