Extended Data Fig. 7. Tomogram thickness distribution for the lift-out experiments.
A box plot for the distribution of tomogram thickness measurements on single-sided and double-sided attachment Serial Lift-Out lamellae. To show the spread of thicknesses among technical replicates of the Serial Lift-Out method, we analyzed the thicknesses obtained from multiple independent experiments. All n = 56 tomograms recorded for the single-sided attachment experiment (experiment 1) and a random selection of n = 132 tomograms from the 1012 tilt series collected for the double-sided attachment 1(experiment 2) were analyzed. All n = 90 tilt series of double-sided attachment 2 (experiment 3) were analyzed. While the average tomogram thickness is lower for single-sided attachment (255 nm ± 126 nm, n = 56) than for double-sided attachment 1 (303 nm ± 40 nm, n = 132) and similar to double-sided attachment 2 (252 nm ± 36 nm, n = 90), the spread of thickness measurements is higher for single-sided attachment, likely due to increased bending of the free-standing lamellae during milling. The box indicates the 25th and 75th percentile, the dashed line the mean of all measurements, and the whiskers indicate the observations within the 1.5x interquartile range. Experiment numbering is given in the Statistics and Reproducibility section.