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. 2024 Sep 3;16(36):46964–46974. doi: 10.1021/acsami.4c10831

Figure 2.

Figure 2

Characterization of the structural integrity and composition by SEM and EDX. (a) and (b) demonstrate the typical IO structure for (a) 16 nm TiO2 IO and (b) 20 nm TiO2–2 nm Fe2O3, both fabricated with 252 nm PS template size. (c) an EDX scan along a 20 nm TiO2–2 nm Fe2O3 cross-section reveals a homogeneous distribution of iron and titanium. (d) Fe2O3-coated IOs present needle-like structures and larger particles at their top surface.