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. 2024 Sep 25;14(42):30590–30605. doi: 10.1039/d4ra05191b

Fig. 11. (a) X-ray diffractogram of BSCF6482 along with the (a1) inset of peak with 100% peak intensity. (b) Rietveld refinement for XRD of BSCF6482.

Fig. 11